Metrology is the science of measurements. As such, it deals with the problem of obtaining knowledge of physical reality through its quantifiable properties. The problems of measurement and of measurement accuracy are central to all natural and technical sciences. Now in its second edition, this monograph conveys the fundamental theory of measurement and provides some algorithms for result testing and validation.

Measurement techniques form the basis of scientific, engineering, and industrial innovations. The methods and instruments of measurement for different fields are constantly improving, and it's necessary to address not only their significance but also the challenges and issues associated with them. Strategic Applications of Measurement Technologies and Instrumentation is a collection of innovative research on the methods and applications of measurement techniques in medical and scientific discoveries, as well as modern industrial applications. The book is divided into two sections with the first focusing on the significance of measurement strategies in physics and biomedical applications and the second examining measurement strategies in industrial applications. Highlighting a range of topics including material assessment, measurement strategies, and nanoscale materials, this book is ideally designed for engineers, academicians, researchers, scientists, software developers, graduate students, and industry professionals.

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.

Photoemission (also known as photoelectron) spectroscopy refers to the process in which an electron is removed from a specimen after the atomic absorption of a photon. The first evidence of this phenomenon dates back to 1887 but it was not until 1905 that Einstein offered an explanation of this effect, which is now referred to as ""the photoelectric effect"".Quantitative Core Level Photoelectron Spectroscopy: A Primer tackles the pragmatic aspects of the photoemission process with the aim of introducing the reader to the concepts and instrumentation that emerge from an experimental approach. The basic elements implemented for the technique are discussed and the geometry of the instrumentation is explained. The book covers each of the features that have been observed in the X-ray photoemission spectra and provides the tools necessary for their understanding and correct identification. Charging effects are covered in the penultimate chapter with the final chapter bringing closure to the basic uses of the X-ray photoemission process, as well as guiding the reader through some of the most popular applications used in current research.

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

The inclusion of an electrical measurement course in the undergraduate curriculum of electrical engineering is important in forming the technical and scientific knowledge of future electrical engineers. This book explains the basic measurement techniques, instruments, and methods used in everyday practice. It covers in detail both analogue and digital instruments, measurements errors and uncertainty, instrument transformers, bridges, amplifiers, oscilloscopes, data acquisition, sensors, instrument controls and measurement systems. The reader will learn how to apply the most appropriate measurement method and instrument for a particular application, and how to assemble the measurement system from physical quantity to the digital data in a computer. The book is primarily intended to cover all necessary topics of instrumentation and measurement for students of electrical engineering, but can also serve as a reference for engineers and practitioners to expand or refresh their knowledge in this field.

How do you draw a straight line? How do you determine if a circle is really round? These may sound like simple or even trivial mathematical problems, but to an engineer the answers can mean the difference between success and failure. "How Round Is Your Circle?" invites readers to explore many of the same fundamental questions that working engineers deal with every day--it's challenging, hands-on, and fun.

John Bryant and Chris Sangwin illustrate how physical models are created from abstract mathematical ones. Using elementary geometry and trigonometry, they guide readers through paper-and-pencil reconstructions of mathematical problems and show them how to construct actual physical models themselves--directions included. It's an effective and entertaining way to explain how applied mathematics and engineering work together to solve problems, everything from keeping a piston aligned in its cylinder to ensuring that automotive driveshafts rotate smoothly. Intriguingly, checking the roundness of a manufactured object is trickier than one might think. When does the width of a saw blade affect an engineer's calculations--or, for that matter, the width of a physical line? When does a measurement need to be exact and when will an approximation suffice? Bryant and Sangwin tackle questions like these and enliven their discussions with many fascinating highlights from engineering history. Generously illustrated, "How Round Is Your Circle?" reveals some of the hidden complexities in everyday things.

This study guide has been written to assist individuals to prepare for certification as a Geometric Dimensioning and Tolerancing Professional (GDTP) through the American Society of Mechanical Engineers (ASME). The objectives of the study guide are to: Introduce the purpose, history, and application process for obtaining Geometric Dimensioning and Tolerancing Professional Certification in accordance with the American Society of Mechanical Engineers (ASME) administrative procedures and the ASME Y14.5.2- 2000 Standard; Develop a systematic study strategy that will assist individuals preparing for the ASME Geometric Dimensioning and Tolerancing Professional Certification written examinations; Provide practice questions and answers that will assist individuals in preparing for the ASME Geometric Dimensioning and Tolerancing Professional Certification written examinations. Contents: Chapter 1 Introduction to ASME GCTD Certification: Purpose of Professional Certification; History of the ASME GDTP Certification Program; Professional Competencies; Technologist Level; Senior Level; Qualifications; Certification Process; Application Procedure; Test Locations and Dates; Certificat Examination Results; Recertification. Chapter 2 Personal Preassessment: Purpose of Personal Preassessment Examination; Answer Sheet; Evaluation of the Results; Answers to Questions; Overall Percentage Correct; Identified Strengths and Weaknesses; Technical Review of Answers. Chapter 3 Preparation Strategies: Body of Knowledge; Technologist Level; Senior Level; Examination Structure; Examination Requirements; Distribution of Questions; Technologist Level Examination; Senior Level Examination. Chapter 4 Study Strategies: Guidelines for Personal Study; Linking Topics; Topic Linking Form; Topic Linking Practice Session; Technologist Level Links; Senior Level Links; Examination Strategies; Multiple-Choice Questions; Writing Multiple-Choice Questions; Answering Multiple-Choice Questions; Topic Linking Exercises. Chapter 5 Technology Level Practice Examination: Purpose of the Examination; Administration of the Examination; Technologist Level Practice Examination; Answer Sheets; Answers, Links and Evaluation of Results; Answers and Links; Evaluation of Test Results; Technical Review of Answers. Chapter 6 Senior Level Practice Examination: Purpose of the Examination; Administration of the Examination; Senior Level Practice Examination; Answer Sheets; Answers, Links and Evaluation of Results; Answers and Links; Evaluation of Test Results; Technical Review of Answers. Chapter 7 Definition of Terms; Appendices: Appendix A - References; Appendix B - Topic Links.

Interest in the applications of ultrawideband (UWB) radar systems is increasing rapidly all over the world. This is evident from the number of monographs recently published on the subject and from the many papers presented at international conferences on the general problems involved in UWB radar and on its promising new applications. Conventional (classical) methods seem to have exhausted their potential and studies in the field are undergoing a profound change. This book presents some of the novel approaches to radar system analysis now being investigated. A good source of information on UWB signals is their structural analysis in the time domain. This allows a greater understanding of the specific features of UWB radar systems, such as the properties of receiving and transmitting antennas, and various characteristics of near- and far-range target scattering fields. It is shown how the systematic application of numerical procedures can provide new results in the evaluation of UWB radar target responses. The authors do not try to cover all of the possible solutions to the problem of multidimensional representation of target responses; rather they aim to give a general understanding of the techniques of confluent analysis, computer holography and adaptive synthesis of antenna apertures. These methods have great potential for solving conventional radar problems in target detection and recognition, and they are sure to stimulate the use of UWB signals in many fields such as subsurface probing and ecological monitoring.

RECENT CASTASTROPHIC STRUCTURAL FAILURES, OCCURING ACROSS MANY INDUSTRIES, HIGHLIGHT THE NEED FOR SOCIETY TO RELATE RISK MORE EXPLICITLY WITH INSPECTION PROGRAMS. THIS VOLUME DESCRIBES AND RECOMMENDS APPROPRIATE PROCESSES AND METHODS USING RISK-BASED INFORMATION TO ESTABLISH INSPECTION GUIDELINES FOR FACILITIES OR STRUCTURAL SYSTEMS.

Accuracy and consistency are essential to success in manufacturing, and the technology of precision measurement is fully explained and illustrated in this important book. Throughout, the author accompanies illustrations of the devices with descriptions of how they are used in industry. Both apprentice and practicing engineers will discover a vast amount of new material that can be applied to virtually any imaginable measurement or calibration task.

During the 1980s, the worldwide interest in electromagnetic compatibility (EMC) grew rapidly with the introduction of legislation to control the growing interference problems generated by the increased use of electronic equipment in industry and in the home. The European directive harmonizing EMC measurements gave particular impetus to manufacturers and importers of electrical and electronic equipment in Europe to understand EMC design techniques and verification procedures. This book explains how equipment can be verified by testing. It discusses the nature of EMC standards world wide and describes in detail testing methods and their conduct and accuracy. In addition to standard EMC testing, topics including electrostatic discharge, nuclear electromagnetic pulse and lightning are also discussed. In the broad span of its subject matter, the interests of equipment manufacturers, EMC test engineers, project managers and company administrators are addressed. The testing of both military and commercial electronic equipment is covered. Particular emphasis is placed on the nature of EMC test equipment and how to use it to make reliable measurements.

The need to measure electrical power is common to many branches of science and engineering. This book presents a wide-ranging survey of the many types of radio-frequency and microwave power meter and the techniques which are used for calibrating and intercomparing them. The frequency range is 1 MHz to 200 GHz. The first of the sixteen chapters considers the fundamentals. Four chapters are then devoted to the subject of calorimetry, which forms the basis of the majority of primary standards for power measurement. A further five chapters describe the various types of non-calorimetric power meter, which include not only the commonly used thermistor, thermoelectric and diode types, but also force-operated instruments and a considerable number of miscellaneous devices. Calibration and intercomparison methods are covered in three closely linked chapters which treat respectively the basic techniques, the use of reflectometers for power meter calibration, and the problems associated with connectors and adapters. In the last three chapters a mixture of topics is covered. First a concise survey of pulsed power measurements is presented. Attention is then given to the topics of voltage and current measurement, which are closely related to power measurement. Finally, the subject of the international intercomparison of standards is discussed and the results of some of the more important intercomparison exercises are summarised.