Phase Change Memory - Device Physics, Reliability and Applications (Hardcover, 1st ed. 2018)

This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains design engineering details on PCM cell architecture, PCM cell arrays (including electrical circuit management), as well as the full spectrum of possible future applications.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Release date:	November 2017
First published:	2018
Editors:	Andrea Redaelli
Dimensions:	235 x 155mm (L x W)
Format:	Hardcover
Pages:	330
Edition:	1st ed. 2018
ISBN-13:	978-3-319-69052-0
Categories:	Books > Computing & IT > Social & legal aspects of computing > Human-computer interaction Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
LSN:	3-319-69052-3
Barcode:	9783319690520

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