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Introduction to Spectroscopic Ellipsometry of Thin Film Materials - Instrumentation, Data Analysis and Applications (Paperback) Loot Price: R2,278
Discovery Miles 22 780
Repayment Terms: R213 pm x 12*
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Introduction to Spectroscopic Ellipsometry of Thin Film Materials - Instrumentation, Data Analysis and Applications...

Introduction to Spectroscopic Ellipsometry of Thin Film Materials - Instrumentation, Data Analysis and Applications (Paperback)

ATS Wee

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Loot Price R2,278 Discovery Miles 22 780 | Repayment Terms: R213 pm x 12*

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Dieses Buch ist eine aktualisierte Einfuhrung in die Anwendung der spektrometrischen Ellipsometrie mit ihrem praktischen Einsatz bei der Untersuchung von Grenzflacheneigenschaften, Elektronenstrukturen und Quasiteilcheneigenschaften verschiedener Klassen von Dunnschichtmaterialien.

General

Imprint: Wiley-VCH Verlag GmbH
Country of origin: Germany
Release date: April 2022
Authors: ATS Wee
Dimensions: 249 x 169 x 12mm (L x W x T)
Format: Paperback
Pages: 208
ISBN-13: 978-3-527-34951-7
Categories: Books > Science & Mathematics > Chemistry > General
Books > Professional & Technical > Mechanical engineering & materials > General
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LSN: 3-527-34951-0
Barcode: 9783527349517

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