Advances in Imaging and Electron Physics, Volume 112 (Hardcover)

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	June 2000
First published:	June 2000
Series editors:	Benjamin Kazan • Peter W. Hawkes • Tom Mulvey
Dimensions:	229 x 152 x 20mm (L x W x T)
Format:	Hardcover
Pages:	338
ISBN-13:	978-0-12-014754-0
Categories:	Books > Professional & Technical > Electronics & communications engineering > General Books > Academic & Education > Professional & Technical > Physics
LSN:	0-12-014754-8
Barcode:	9780120147540

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