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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials
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Buy Now
Design for AT-Speed Test, Diagnosis and Measurement (Hardcover, 2000 ed.)
Loot Price: R4,551
Discovery Miles 45 510
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Design for AT-Speed Test, Diagnosis and Measurement (Hardcover, 2000 ed.)
Series: Frontiers in Electronic Testing, 15
Expected to ship within 12 - 17 working days
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Design for AT-Speed Test, Diagnosis and Measurement is the first
book to offer practical and proven design-for-testability (DFT)
solutions to chip and system design engineers, test engineers and
product managers at the silicon level as well as at the board and
systems levels. Designers will see how the implementation of
embedded test enables simplification of silicon debug and system
bring-up. Test engineers will determine how embedded test provides
a superior level of at-speed test, diagnosis and measurement
without exceeding the capabilities of their equipment. Product
managers will learn how the time, resources and costs associated
with test development, manufacture cost and lifecycle maintenance
of their products can be significantly reduced by designing
embedded test in the product. A complete design flow and analysis
of the impact of embedded test on a design makes this book a must
read' before any DFT is attempted.
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