The application of solid-state detectors of high energy resolution
to x-ray spectrometry, and the increasing use of compu ters in both
measurement and data evaluation, are giving a new stimulus to x-ray
techniques in analytical chemistry. The Twentieth Annual Denver
X-ray Conference reflects this renewed interest in several ways.
The invited papers, grouped in Session I, review the charac
teristics of the detectors used in the measurement of x-rays. One
paper is dedicated to the detection of single ions. Although such a
subject may appear to be marginal to the purposes of the Denver
Conference, we must recognize the affinity of techniques applied to
similar purposes. Ion probe mass spectrometry is dedicated to tasks
similar to those performed by x-ray spectrometry with the electron
probe microanalyzer. Scientists and technologists will see these
two techniques discussed in the same meetings. The discussion of
automation and programming is not limited to the two invited
speakers, but extends to papers presented in more than one session.
The matter of fluorescence analysis by isotope- and tube-excitation
will also be of great interest to those concerned with the
practical applications of x-ray techniques. The communications
contained in this volume, and the lively discussions which
frequently followed the presentation of papers, attest to the
vitality of the subjects which are the concern of the Annual Denver
X-ray Conference."
General
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