Optical Phenomena in Semiconductor Structures of Reduced Dimensions (Paperback, Softcover reprint of the original 1st ed. 1993)

Remarkable advances in semiconductor growth and processing technologies continue to have a profound impact on condensed-matter physics and to stimulate the invention of novel optoelectronic effects. Intensive research on the behaviors of free carriers has been carried out in the two-dimensional systems of semiconductor heterostructures and in the one and zero-dimensional systems of nanostructures created by the state-of-the-art fabrication methods. These studies have uncovered unexpected quantum mechanical correlations that arise because of the combined effects of strong electron-electron interactions and wave function confinement associated with reduced dimensionality. The investigations of these phenomena are currently at the frontiers of condensed-matter physics. They include areas like the fractional quantum Hall effect, the dynamics of electrons on an ultra short (femtosecond) time scale, electron behavior in quantum wires and dots, and studies of electron tunneling phenomena in ultra small semiconductor structures. Optical techniques have made important contributions to these fields in recent years, but there has been no coherent review of this work until now. The book provides an overview of these recent developments that will be of interest to semiconductor materials scientists in university, government and industrial laboratories.

General

Imprint:	Springer
Country of origin:	Netherlands
Series:	NATO Science Series E:, 248
Release date:	October 2012
First published:	1993
Editors:	D.J. Lockwood • Aron Pinczuk
Dimensions:	240 x 160 x 24mm (L x W x T)
Format:	Paperback
Pages:	454
Edition:	Softcover reprint of the original 1st ed. 1993
ISBN-13:	978-9401048453
Categories:	Books > Science & Mathematics > Physics > Optics (light) Books > Science & Mathematics > Physics > States of matter > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	9401048452
Barcode:	9789401048453

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