High Resolution X-Ray Diffractometry And Topography (Hardcover)

The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.

General

Imprint:	Taylor & Francis
Country of origin:	United Kingdom
Release date:	February 1998
First published:	1998
Authors:	D.K. Bowen • Brian K. Tanner
Dimensions:	246 x 174 x 20mm (L x W x T)
Format:	Hardcover
Pages:	264
ISBN-13:	978-0-85066-758-5
Categories:	Books > Science & Mathematics > Physics > Optics (light) Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Promotions
LSN:	0-85066-758-5
Barcode:	9780850667585

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