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Books > Science & Mathematics > Physics > Optics (light)
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High Resolution X-Ray Diffractometry And Topography (Paperback)
Loot Price: R2,100
Discovery Miles 21 000
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High Resolution X-Ray Diffractometry And Topography (Paperback)
Expected to ship within 12 - 19 working days
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The study and application of electronic materials has created an
increasing demand for sophisticated and reliable techniques for
examining and characterizing these materials. This comprehensive
book looks at the area of x-ray diffraction and the modern
techniques available for deployment in research, development, and
production. It provides the theoretical and practical background
for applying these techniques in scientific and industrial
materials characterization. The main aim of the book is to map the
theoretical and practical background necessary to the study of
single crystal materials by means of high-resolution x-ray
diffraction and topography. It combines mathematical formalisms
with graphical explanations and hands-on practical advice for
interpreting data.
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