The study and application of electronic materials has created an
increasing demand for sophisticated and reliable techniques for
examining and characterizing these materials. This comprehensive
book looks at the area of x-ray diffraction and the modern
techniques available for deployment in research, development, and
production. It provides the theoretical and practical background
for applying these techniques in scientific and industrial
materials characterization. The main aim of the book is to map the
theoretical and practical background necessary to the study of
single crystal materials by means of high-resolution x-ray
diffraction and topography. It combines mathematical formalisms
with graphical explanations and hands-on practical advice for
interpreting data.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
