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Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Reliability engineering

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Design and Verification of Microprocessor Systems for High-Assurance Applications (Hardcover, 2010 Ed.) Loot Price: R4,469
Discovery Miles 44 690
You Save: R526 (11%)
Design and Verification of Microprocessor Systems for High-Assurance Applications (Hardcover, 2010 Ed.): David S. Hardin

Design and Verification of Microprocessor Systems for High-Assurance Applications (Hardcover, 2010 Ed.)

David S. Hardin

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List price R4,995 Loot Price R4,469 Discovery Miles 44 690 | Repayment Terms: R419 pm x 12* You Save R526 (11%)

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Microprocessors increasingly control and monitor our most critical systems, including automobiles, airliners, medical systems, transportation grids, and defense systems. The relentless march of semiconductor process technology has given engineers exponentially increasing transistor budgets at constant recurring cost. This has encouraged increased functional integration onto a single die, as well as increased architectural sophistication of the functional units themselves. Additionally, design cycle times are decreasing, thus putting increased schedule pressure on engineers. Not surprisingly, this environment has led to a number of uncaught design flaws. Traditional simulation-based design verification has not kept up with the scale or pace of modern microprocessor system design. Formal verification methods offer the promise of improved bug-finding capability, as well as the ability to establish functional correctness of a detailed design relative to a high-level specification. However, widespread use of formal methods has had to await breakthroughs in automated reasoning, integration with engineering design languages and processes, scalability, and usability.

This book presents several breakthrough design and verification techniques that allow these powerful formal methods to be employed in the real world of high-assurance microprocessor system design.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: March 2010
First published: 2010
Editors: David S. Hardin
Dimensions: 235 x 155 x 25mm (L x W x T)
Format: Hardcover
Pages: 436
Edition: 2010 Ed.
ISBN-13: 978-1-4419-1538-2
Categories: Books > Professional & Technical > Technology: general issues > Technical design > Computer aided design (CAD)
Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Reliability engineering
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 1-4419-1538-9
Barcode: 9781441915382

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