0
Your cart

Your cart is empty

Books > Professional & Technical > Energy technology & engineering > Electrical engineering

Buy Now

Hierarchical Modeling for VLSI Circuit Testing (Paperback, Softcover reprint of the original 1st ed. 1990) Loot Price: R2,839
Discovery Miles 28 390
Hierarchical Modeling for VLSI Circuit Testing (Paperback, Softcover reprint of the original 1st ed. 1990): Debashis...

Hierarchical Modeling for VLSI Circuit Testing (Paperback, Softcover reprint of the original 1st ed. 1990)

Debashis Bhattacharya, John P. Hayes

Series: The Springer International Series in Engineering and Computer Science, 89

 (sign in to rate)
Loot Price R2,839 Discovery Miles 28 390 | Repayment Terms: R266 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated circuit technology. It is long been recognized that the testing prob lem can be alleviated by the use of higher-level methods in which multigate modules or cells are the primitive components in test generation; however, the development of such methods has proceeded very slowly. To be acceptable, high-level approaches should be applicable to most types of digital circuits, and should provide fault coverage comparable to that of traditional, low-level methods. The fault coverage problem has, perhaps, been the most intractable, due to continued reliance in the testing industry on the single stuck-line (SSL) fault model, which is tightly bound to the gate level of abstraction. This monograph presents a novel approach to solving the foregoing problem. It is based on the systematic use of multibit vectors rather than single bits to represent logic signals, including fault signals. A circuit is viewed as a collection of high-level components such as adders, multiplexers, and registers, interconnected by n-bit buses. To match this high-level circuit model, we introduce a high-level bus fault that, in effect, replaces a large number of SSL faults and allows them to be tested in parallel. However, by reducing the bus size from n to one, we can obtain the traditional gate-level circuit and models."

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: The Springer International Series in Engineering and Computer Science, 89
Release date: September 2011
First published: 1990
Authors: Debashis Bhattacharya • John P. Hayes
Dimensions: 235 x 155 x 10mm (L x W x T)
Format: Paperback
Pages: 160
Edition: Softcover reprint of the original 1st ed. 1990
ISBN-13: 978-1-4612-8819-0
Categories: Books > Professional & Technical > Technology: general issues > Technical design > Computer aided design (CAD)
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Promotions
LSN: 1-4612-8819-3
Barcode: 9781461288190

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

You might also like..

Power System Analysis and Design, SI…
J. Duncan Glover, Mulukutla Sarma, … Paperback R1,396 R1,296 Discovery Miles 12 960
Eskom - Power, Politics And The (Post…
Faeeza Ballim Paperback R320 R295 Discovery Miles 2 950
Hybrid-Renewable Energy Systems in…
Hina Fathima, Prabaharan N, … Paperback R4,778 R4,431 Discovery Miles 44 310
Smart Sensors and MEMS - Intelligent…
S. Nihtianov, A. Luque Paperback R6,688 R6,173 Discovery Miles 61 730
Ultra-Supercritical Coal Power Plants…
Dongke Zhang Ftse Hardcover R4,332 R4,026 Discovery Miles 40 260
Biomass Combustion Science, Technology…
Lasse Rosendahl Hardcover R4,656 Discovery Miles 46 560
Combined Cycle Systems for Near-Zero…
Ashok D Rao Hardcover R4,477 Discovery Miles 44 770
High Temperature Superconductors (HTS…
Ziad Melhem Hardcover R4,774 Discovery Miles 47 740
Power Plant Life Management and…
John E. Oakey Hardcover R6,060 Discovery Miles 60 600
Microgeneration - Low energy strategies…
Dave Parker Paperback R982 Discovery Miles 9 820
Practical Grounding, Bonding, Shielding…
G. Vijayaraghavan, Mark Brown, … Paperback R1,513 Discovery Miles 15 130
Power Electronic Control in Electrical…
Enrique Acha, Vassilios Agelidis, … Hardcover R3,295 Discovery Miles 32 950

See more

Partners