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Books > Computing & IT > Applications of computing > Databases > Data mining

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Knowledge-Driven Board-Level Functional Fault Diagnosis (Paperback, Softcover reprint of the original 1st ed. 2017) Loot Price: R2,677
Discovery Miles 26 770
Knowledge-Driven Board-Level Functional Fault Diagnosis (Paperback, Softcover reprint of the original 1st ed. 2017): Fangming...

Knowledge-Driven Board-Level Functional Fault Diagnosis (Paperback, Softcover reprint of the original 1st ed. 2017)

Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu

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Loot Price R2,677 Discovery Miles 26 770 | Repayment Terms: R251 pm x 12*

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This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. * Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;* Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;* Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.

General

Imprint: Springer International Publishing AG
Country of origin: Switzerland
Release date: June 2018
First published: 2017
Authors: Fangming Ye • Zhaobo Zhang • Krishnendu Chakrabarty • Xinli Gu
Dimensions: 235 x 155 x 9mm (L x W x T)
Format: Paperback
Pages: 147
Edition: Softcover reprint of the original 1st ed. 2017
ISBN-13: 978-3-319-82054-5
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Computing & IT > Applications of computing > Databases > Data mining
LSN: 3-319-82054-0
Barcode: 9783319820545

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