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Books > Professional & Technical > Energy technology & engineering > Electrical engineering

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Thermal Testing of Integrated Circuits (Paperback, Softcover reprint of the original 1st ed. 2002) Loot Price: R2,768
Discovery Miles 27 680
Thermal Testing of Integrated Circuits (Paperback, Softcover reprint of the original 1st ed. 2002): J. Altet, Antonio Rubio

Thermal Testing of Integrated Circuits (Paperback, Softcover reprint of the original 1st ed. 2002)

J. Altet, Antonio Rubio

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Loot Price R2,768 Discovery Miles 27 680 | Repayment Terms: R259 pm x 12*

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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: April 2014
First published: 2002
Authors: J. Altet • Antonio Rubio
Dimensions: 235 x 155 x 12mm (L x W x T)
Format: Paperback
Pages: 204
Edition: Softcover reprint of the original 1st ed. 2002
ISBN-13: 978-1-4419-5287-5
Categories: Books > Professional & Technical > Mechanical engineering & materials > Production engineering > General
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN: 1-4419-5287-X
Barcode: 9781441952875

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