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Advances in x-Ray Analysis, Vol.37 - Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, (Hardcover)
Loot Price: R2,490
Discovery Miles 24 900
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Advances in x-Ray Analysis, Vol.37 - Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, (Hardcover)
Expected to ship within 12 - 17 working days
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89 articles organized under the following section heads: Impact of
Computers on Xray Analysis. Applications of Whole Pattern Fitting:
Structure Determination, Phase Identification, Lattice Parameters.
Search/Match Methods, Phase Identification. Diffraction from Single
Crystals and Epitaxial Films. Xray Characterization of Films and
Surface Layers. Strain and Stress Determination, Xray Fractography,
Diffraction Peak Broadening Analysis. Advances in Detectors and
Counting Electronics. XRD Techniques and Instrumentation,
Nonambient Applications, Texture, other Applications. Xray Optics,
Monochromators and Synthetic Multilayers. Total Reflection XRF
Applications and Instrumentation, other XRF Techniques and
Instrumentation. Mathematical Techniques in Xray Spectrometry.
Geological and other Applications of XRS. Index.
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