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Advances in x-Ray Analysis, Vol.37 - Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, (Hardcover) Loot Price: R2,522
Discovery Miles 25 220
Advances in x-Ray Analysis, Vol.37 - Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held...

Advances in x-Ray Analysis, Vol.37 - Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6, (Hardcover)

John V. Gilfrich; Edited by C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan

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Loot Price R2,522 Discovery Miles 25 220 | Repayment Terms: R236 pm x 12*

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89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.

General

Imprint: Kluwer Academic / Plenum Publishers
Country of origin: Netherlands
Release date: September 1994
First published: October 1994
Authors: John V. Gilfrich
Editors: C.C. Goldsmith • Ting C. Huang • Ron Jenkins • I. Cev Noyan
Dimensions: 260 x 178mm (L x W)
Format: Hardcover
Pages: 778
ISBN-13: 978-0-306-44901-7
Categories: Books > Science & Mathematics > Chemistry > Analytical chemistry > General
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LSN: 0-306-44901-3
Barcode: 9780306449017

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