System-on-a-Chip (SOC) integrated circuits composed of embedded
cores are now commonplace. Nevertheless, there remain several
roadblocks to rapid and efficient system integration. Test
development is seen as a major bottleneck in SOC design and
manufacturing capabilities. Testing SOCs is especially challenging
in the absence of standardized test structures, test automation
tools, and test protocols. In addition, long interconnects, high
density, and high-speed designs lead to new types of faults
involving crosstalk and signal integrity.
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
is an edited work containing thirteen contributions that address
various aspects of SOC testing.
SOC (System-on-a-Chip) Testing for Plug and Play Test Automation
is a valuable reference for researchers and students interested in
various aspects of SOC testing.
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