Thin Film Materials - Stress, Defect Formation and Surface Evolution (Paperback)

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.

General

Imprint:	Cambridge UniversityPress
Country of origin:	United Kingdom
Release date:	December 2008
First published:	November 2010
Authors:	L. B. Freund • S. Suresh
Dimensions:	244 x 170 x 39mm (L x W x T)
Format:	Paperback - Trade
Pages:	770
ISBN-13:	978-0-521-52977-8
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
LSN:	0-521-52977-8
Barcode:	9780521529778

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