CMOS Test and Evaluation: A Physical Perspective is a single source
for an integrated view of test and data analysis methodology for
CMOS products, covering circuit sensitivities to MOSFET
characteristics, impact of silicon technology process variability,
applications of embedded test structures and sensors, product
yield, and reliability over the lifetime of the product. This book
also covers statistical data analysis and visualization techniques,
test equipment and CMOS product specifications, and examines
product behavior over its full voltage, temperature and frequency
range.
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