CMOS Test and Evaluation - A Physical Perspective (Hardcover, 2015 ed.)

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	December 2014
First published:	2015
Authors:	Manjul Bhushan • Mark B. Ketchen
Dimensions:	235 x 155 x 32mm (L x W x T)
Format:	Hardcover
Pages:	424
Edition:	2015 ed.
ISBN-13:	978-1-4939-1348-0
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Reliability engineering Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
LSN:	1-4939-1348-4
Barcode:	9781493913480

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