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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials
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Microelectronic Test Structures for CMOS Technology (Paperback, 2011 ed.)
Loot Price: R3,644
Discovery Miles 36 440
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Microelectronic Test Structures for CMOS Technology (Paperback, 2011 ed.)
Expected to ship within 10 - 15 working days
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Microelectronic Test Structures for CMOS Technology and Products
addresses the basic concepts of the design of test structures for
incorporation within test-vehicles, scribe-lines, and CMOS
products. The role of test structures in the development and
monitoring of CMOS technologies and products has become ever more
important with the increased cost and complexity of development and
manufacturing. In this timely volume, IBM scientists Manjul Bhushan
and Mark Ketchen emphasize high speed characterization techniques
for digital CMOS circuit applications and bridging between circuit
performance and characteristics of MOSFETs and other circuit
elements. Detailed examples are presented throughout, many of which
are equally applicable to other microelectronic technologies as
well. The authors' overarching goal is to provide students and
technology practitioners alike a practical guide to the disciplined
design and use of test structures that give unambiguous information
on the parametrics and performance of digital CMOS technology.
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