|
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials
|
Buy Now
Microelectronic Test Structures for CMOS Technology (Paperback, 2011 ed.)
Loot Price: R3,363
Discovery Miles 33 630
|
|
|
Microelectronic Test Structures for CMOS Technology (Paperback, 2011 ed.)
Expected to ship within 18 - 22 working days
|
Microelectronic Test Structures for CMOS Technology and Products
addresses the basic concepts of the design of test structures for
incorporation within test-vehicles, scribe-lines, and CMOS
products. The role of test structures in the development and
monitoring of CMOS technologies and products has become ever more
important with the increased cost and complexity of development and
manufacturing. In this timely volume, IBM scientists Manjul Bhushan
and Mark Ketchen emphasize high speed characterization techniques
for digital CMOS circuit applications and bridging between circuit
performance and characteristics of MOSFETs and other circuit
elements. Detailed examples are presented throughout, many of which
are equally applicable to other microelectronic technologies as
well. The authors' overarching goal is to provide students and
technology practitioners alike a practical guide to the disciplined
design and use of test structures that give unambiguous information
on the parametrics and performance of digital CMOS technology.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
You might also like..
|
Email address subscribed successfully.
A activation email has been sent to you.
Please click the link in that email to activate your subscription.
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
