The II. International Conference on Ion Beam Surface Layer Analysis
was held on September 15-19, 1975 at the Nuclear Research Center,
Karlsruhe, Germany. The date fell between two related con ferences:
"Application of Ion-Beams to Materials" at Warwick, Eng land and
"Atomic Collisions in Solids" at Amsterdam, the Nether lands. The
first conference on Ion Beam Surface Layer Analysis was held at
Yorktown Heights, New York, 1973. The major topic of that and the
present conference was the material analysis with ion beams
including backscattering and channeling, nuclear reactions and ion
induced X-rays with emphasis on technical problems and no vel
applications. The increasing interest in this field was docu mented
by 7 invited papers and 85 contributions which were presen ted at
the meeting in Karlsruhe to about 150 participants from 21
countries. The oral presentations were followed by parallel ses
sions on "Fundamental Aspects," "Analytical Problems" and "Appli
cations" encouraging detailed discussions on the topics of most
current interest. Summaries of these sessions were presented by the
discussion leaders to the whole conference. All invited and
contributed papers are included in these proceedings; summaries of
the discussion sessions will appear in a separate booklet and are
availble from the editors. The application of ion beams to material
analysis is now well established."
General
Imprint: |
Springer-Verlag New York
|
Country of origin: |
United States |
Release date: |
2012 |
First published: |
1976 |
Authors: |
Otto Meyer
|
Dimensions: |
254 x 178 x 26mm (L x W x T) |
Format: |
Paperback
|
Pages: |
491 |
Edition: |
Softcover reprint of the original 1st ed. 1976 |
ISBN-13: |
978-1-4615-8881-8 |
Categories: |
Books >
Science & Mathematics >
Physics >
Atomic & molecular physics
Promotions
|
LSN: |
1-4615-8881-2 |
Barcode: |
9781461588818 |
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