High Performance Memory Testing - Design Principles, Fault Modeling and Self-Test (Paperback, Softcover reprint of the original 1st ed. 2003)

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Series:	Frontiers in Electronic Testing, 22A
Release date:	April 2013
First published:	2003
Authors:	R. Dean Adams
Dimensions:	235 x 155 x 14mm (L x W x T)
Format:	Paperback
Pages:	250
Edition:	Softcover reprint of the original 1st ed. 2003
ISBN-13:	978-1-4757-8474-9
Categories:	Books > Professional & Technical > Technology: general issues > Technical design > Computer aided design (CAD) Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	1-4757-8474-0
Barcode:	9781475784749

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