0
Your cart

Your cart is empty

Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics

Buy Now

Poisson Point Processes - Imaging, Tracking, and Sensing (Paperback, 2010 ed.) Loot Price: R4,228
Discovery Miles 42 280
Poisson Point Processes - Imaging, Tracking, and Sensing (Paperback, 2010 ed.): Roy L Streit

Poisson Point Processes - Imaging, Tracking, and Sensing (Paperback, 2010 ed.)

Roy L Streit

 (sign in to rate)
Loot Price R4,228 Discovery Miles 42 280 | Repayment Terms: R396 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

"Poisson Point Processes provides an overview of non-homogeneous and multidimensional Poisson point processes and their numerous applications. Readers will find constructive mathematical tools and applications ranging from emission and transmission computed tomography to multiple target tracking and distributed sensor detection, written from an engineering perspective. A valuable discussion of the basic properties of finite random sets is included. Maximum likelihood estimation techniques are discussed for several parametric forms of the intensity function, including Gaussian sums, together with their Cramer-Rao bounds. These methods are then used to investigate: -Several medical imaging techniques, including positron emission tomography (PET), single photon emission computed tomography (SPECT), and transmission tomography (CT scans) -Various multi-target and multi-sensor tracking applications, -Practical applications in areas like distributed sensing and detection, -Related finite point processes such as marked processes, hard core processes, cluster processes, and doubly stochastic processes, Perfect for researchers, engineers and graduate students working in electrical engineering and computer science, Poisson Point Processes will prove to be an extremely valuable volume for those seeking insight into the nature of these processes and their diverse applications.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: October 2014
First published: 2010
Authors: Roy L Streit
Dimensions: 235 x 155 x 15mm (L x W x T)
Format: Paperback
Pages: 273
Edition: 2010 ed.
ISBN-13: 978-1-4899-9449-3
Categories: Books > Science & Mathematics > Mathematics > Probability & statistics
Books > Computing & IT > General theory of computing > Mathematical theory of computation
Books > Science & Mathematics > Mathematics > Applied mathematics > Mathematics for scientists & engineers
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
LSN: 1-4899-9449-1
Barcode: 9781489994493

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

Partners