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Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)

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X-Ray Multiple-Wave Diffraction - Theory and Application (Paperback, Softcover reprint of hardcover 1st ed. 2004) Loot Price: R4,054
Discovery Miles 40 540
X-Ray Multiple-Wave Diffraction - Theory and Application (Paperback, Softcover reprint of hardcover 1st ed. 2004): Shih-Lin...

X-Ray Multiple-Wave Diffraction - Theory and Application (Paperback, Softcover reprint of hardcover 1st ed. 2004)

Shih-Lin Chang

Series: Springer Series in Solid-State Sciences, 143

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Loot Price R4,054 Discovery Miles 40 540 | Repayment Terms: R380 pm x 12*

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X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two or higher-dimensional structures, like 2-d and 3-d crystals and even quasi crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction."

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Solid-State Sciences, 143
Release date: December 2010
First published: 2004
Authors: Shih-Lin Chang
Dimensions: 235 x 155 x 23mm (L x W x T)
Format: Paperback
Pages: 436
Edition: Softcover reprint of hardcover 1st ed. 2004
ISBN-13: 978-3-642-05947-6
Categories: Books > Science & Mathematics > Physics > Particle & high-energy physics
Books > Science & Mathematics > Mathematics > Applied mathematics > General
Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
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LSN: 3-642-05947-3
Barcode: 9783642059476

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