Noise in Nanoscale Semiconductor Devices (Paperback, 1st ed. 2020)

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.

General

Imprint:	Springer Nature Switzerland AG
Country of origin:	Switzerland
Release date:	April 2021
First published:	2020
Editors:	Tibor Grasser
Dimensions:	235 x 155mm (L x W)
Format:	Paperback
Pages:	729
Edition:	1st ed. 2020
ISBN-13:	978-3-03-037502-7
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General Promotions
LSN:	3-03-037502-1
Barcode:	9783030375027

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