From Statistics to Neural Networks - Theory and Pattern Recognition Applications (Paperback, Softcover reprint of the original 1st ed. 1994)

The NATO Advanced Study Institute From Statistics to Neural Networks, Theory and Pattern Recognition Applications took place in Les Arcs, Bourg Saint Maurice, France, from June 21 through July 2, 1993. The meeting brought to gether over 100 participants (including 19 invited lecturers) from 20 countries. The invited lecturers whose contributions appear in this volume are: L. Almeida (INESC, Portugal), G. Carpenter (Boston, USA), V. Cherkassky (Minnesota, USA), F. Fogelman Soulie (LRI, France), W. Freeman (Berkeley, USA), J. Friedman (Stanford, USA), F. Girosi (MIT, USA and IRST, Italy), S. Grossberg (Boston, USA), T. Hastie (AT&T, USA), J. Kittler (Surrey, UK), R. Lippmann (MIT Lincoln Lab, USA), J. Moody (OGI, USA), G. Palm (U1m, Germany), B. Ripley (Oxford, UK), R. Tibshirani (Toronto, Canada), H. Wechsler (GMU, USA), C. Wellekens (Eurecom, France) and H. White (San Diego, USA). The ASI consisted of lectures overviewing major aspects of statistical and neural network learning, their links to biological learning and non-linear dynamics (chaos), and real-life examples of pattern recognition applications. As a result of lively interactions between the participants, the following topics emerged as major themes of the meeting: (1) Unified framework for the study of Predictive Learning in Statistics and Artificial Neural Networks (ANNs); (2) Differences and similarities between statistical and ANN methods for non parametric estimation from examples (learning); (3) Fundamental connections between artificial learning systems and biological learning systems."

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	NATO ASI Subseries F:, 136
Release date:	December 2011
First published:	1994
Editors:	Vladimir Cherkassky • Jerome H. Friedman • Harry Wechsler
Dimensions:	235 x 155 x 21mm (L x W x T)
Format:	Paperback
Pages:	394
Edition:	Softcover reprint of the original 1st ed. 1994
ISBN-13:	978-3-642-79121-5
Categories:	Books > Science & Mathematics > Mathematics > Probability & statistics Books > Computing & IT > Applications of computing > Pattern recognition Books > Science & Mathematics > Mathematics > Applied mathematics > Mathematics for scientists & engineers Books > Computing & IT > Applications of computing > Artificial intelligence > General Books > Computing & IT > Applications of computing > Image processing > General Promotions
LSN:	3-642-79121-2
Barcode:	9783642791215

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