Trace-Based Post-Silicon Validation for VLSI Circuits (Hardcover, 2013 ed.)

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Series:	Lecture Notes in Electrical Engineering, 252
Release date:	June 2013
First published:	2013
Authors:	Xiao Liu • Qiang Xu
Dimensions:	235 x 155 x 15mm (L x W x T)
Format:	Hardcover
Pages:	108
Edition:	2013 ed.
ISBN-13:	978-3-319-00532-4
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
LSN:	3-319-00532-4
Barcode:	9783319005324

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