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Trace-Based Post-Silicon Validation for VLSI Circuits (Hardcover, 2013 ed.)
Loot Price: R2,908
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Trace-Based Post-Silicon Validation for VLSI Circuits (Hardcover, 2013 ed.)
Series: Lecture Notes in Electrical Engineering, 252
Expected to ship within 10 - 15 working days
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This book first provides a comprehensive coverage of
state-of-the-art validation solutions based on real-time signal
tracing to guarantee the correctness of VLSI circuits. The authors
discuss several key challenges in post-silicon validation and
provide automated solutions that are systematic and cost-effective.
A series of automatic tracing solutions and innovative design for
debug (DfD) techniques are described, including techniques for
trace signal selection for enhancing visibility of functional
errors, a multiplexed signal tracing strategy for improving
functional error detection, a tracing solution for debugging
electrical errors, an interconnection fabric for increasing data
bandwidth and supporting multi-core debug, an interconnection
fabric design and optimization technique to increase transfer
flexibility and a DfD design and associated tracing solution for
improving debug efficiency and expanding tracing window. The
solutions presented in this book improve the validation quality of
VLSI circuits, and ultimately enable the design and fabrication of
reliable electronic devices.
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