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Multi-Chip Module Test Strategies (Hardcover, Reprinted from JOURNAL OF ELECTRONIC TESTING, 10:1-2, 1997)
Loot Price: R3,182
Discovery Miles 31 820
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Multi-Chip Module Test Strategies (Hardcover, Reprinted from JOURNAL OF ELECTRONIC TESTING, 10:1-2, 1997)
Series: Frontiers in Electronic Testing, 7
Expected to ship within 12 - 17 working days
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MCMs today consist of complex and dense VLSI devices mounted into
packages that allow little physical access to internal nodes. The
complexity and cost associated with their test and diagnosis are
major obstacles to their use. Multi-Chip Module Test Strategies
presents state-of-the-art test strategies for MCMs. This volume of
original research is designed for engineers interested in practical
implementations of MCM test solutions and for designers looking for
leading edge test and design-for-testability solutions for their
next designs. Multi-Chip Module Test Strategies consists of eight
contributions by leading researchers. It is designed to provide a
comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a
special issue of the Journal of Electronic Testing: Theory and
Applications (JETTA, Volume 10, Numbers 1 and 2).
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