This thesis transports you to a wonderful and fascinating
small-scale world and tells you the origin of several new
phenomena. The investigative tool is the improved discrete
dislocation-based multi-scale approaches, bridging the continuum
modeling and atomistic simulation. Mechanism-based theoretical
models are put forward to conveniently predict the mechanical
responses and defect evolution. The findings presented in this
thesis yield valuable new guidelines for microdevice design,
reliability analysis and defect tuning.
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