Optical second harmonic and sum-frequency generation has evolved
into a useful spectroscopic tool for material characterization,
especially as a viable and powerful technique for probing surfaces
and interfaces. This book serves as an introduction on the
technique. It provides a comprehensible description on the basics
of the technique and gives detailed accounts with illustrating
examples on the wide range of applications of the technique. It
clearly points out the unique capabilities of the technique as a
spectroscopic tool for studies of bulk and interface structures in
different disciplines.This book is an updated version of an earlier
book on the same subject, but it puts more emphasis on physical
concepts and description. It underscores recent advances of
sum-frequency spectroscopy at the technical front as well as over
its wide range of applications, with the author's perspective in
each area. Most chapters end with a section of summary and
prospects that hopefully can help stimulate interest to further
develop the technique and explore possibilities of applying the
technique.
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