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The 37th Annual Denver Conference on Applications of X-Ray Analysis
was held August 1-5, 1988, at the Sheraton Steamboat Resort and
Conference Center, Steamboat Springs, Colorado. As usual,
alternating with x-ray diffraction, the emphasis this year was
x-ray fluorescence, but as has been the pattern for several
occasions over the last few years, the Plenary Session did not deal
with that subject, specifically. In an attempt to introduce the
audience to one of the new developments in x-ray analysis, the
title of the session was "High Brilliance Sources/Applications,"
and dealt exclusively with synchrotron radiation, a topic which has
made a very large impact on the x-ray community over the last
decade. As the organizer and co-chairman of the Plenary Session
(with Paul Predecki), it is my responsibility to report on that
session here. The Conference had the privilege of obtaining the
services of some of the preeminent practitioners of research using
this remarkable x-ray source; they presented the audience with
unusually lucid descriptions of the work which has been
accomplished in the development and application of the continuous,
high intensity, tunable, polarized and collimated x-rays available
from no facility other than these specialized storage rings. The
opening lecture (and I use that term intentionally) was an
enthusiastic description of "What is Synchrotron Radiation?" by
Professor Boris Batterman of Cornell University and the Cornell
High Energy Synchrotron Sourc(! (CHESS).
The University of Denver and its staff members deserve much credit
for organizing and operating this Denver X-ray Conference year
after year, for there seems to be no doubt that it and the yolumes
that result from it are filling a need. The interests covered by
the papers at one of these conferences vary from year to year and
as a whole cover a wide spread of topics. This is as it should be.
Old problems that have been with us for many years are being
attacked again with new and more effective tools, new problems are
continually arising, and new methods of great power are being
developed. These developments are occurring in each of the fields
covered, as may readily be seen by a glance at this twelfth volume
and other recent volumes of this series. It seems clear that the
policy of having these conferences and these volumes cover a wide
field rather than a single one such as, for example, structure
determination, or fluorescence analysis, is a policy that meets
with general approval and should be continued. I understand there
is every intention to do so. C. S. Barrett It is customary to
acknowledge in each volume the invited session chairmen of the
three-day meeting. They and the sessions at which they presided
(21-23 August 1968) were as follows: CRYSTALLOGRAPHY AND
DIFFRACTION. C. S. Barrett, University of Chicago, Chicago,
Illinois. METHODS AND THEIR APPLICATIONS. B. C. Giessen,
Massachusetts Institute of Technology, Cambridge, Massachusetts.
The 35th Annual Denver Conference on Applications of X-Ray Analysis
was held August 4-8, 1986, on the campus of the University of
Denver. Since the previous year's conference had emphasized x-ray
diffraction, this year the Plenary Session spotlighted x-ray
fluorescence, with the title "Trends in XRF: A World Perspective,"
featuring renowned speakers from three major areas. XRF IN NORTH
AMERICA, by Prof. D. E. Leydon, from Colorado State University,
dealt specifically with developments in the fields of
instrumentation, data treatment and applications in that part of
the world. Prof. H. Ebel, from the Technical University of Vienna,
discussed XRF IN EUROPE, concentrating on subjects including total
reflection, improved fundamental parameters, quantitation without
standards and imaging techniques. Tomoya Arai, of the Rigaku
Industrial Corporation in Japan, in considering XRF IN THE FAR
EAST, described the scientific activity in XRF and the applications
thereof, primarily in Japan and China. These plenary lectures were
interspersed with short discussions of PERSONAL OBSERVATIONS on the
subject by the co-chairmen of the SeSSion, Ron Jenkins and myself.
The intent of this session was to bring the audience up-to-date on
the status of the field in various parts of the world, and to give
some feeling concerning where it is likely to go in the immediate
future. Hopefully, the publication of the written versions of those
presentations in this volume will make the authors' thoughts
available to many who could not be present at the conference.
The continuing success of the Denver X-Ray Conference is, it seems
to me, the consequence of three equally important facets of each
meeting. These are: 1) the collegial atmosphere and workshops at
which experts and novices mix, talk, and informally share
information at many levels; 2) the plenary session at which
information is presented that intentionally brings new ideas to
attendees to broaden the scope of the field; and 3) the traditional
sessions in which interesting reports on current research and
applications are presented in a timely and professional way. The
first and last of these are discussed separately by Paul Predecki
and are organized (no small task ) by the entire advisory board.
This requires much more than deciding whether yet another workshop
on specimen preparation is needed and whom to prevail upon to
organize and present it. In fact, few attendees at these workshops
ever appreciate the level of effort that Paul and his staff expend
to make sure everything comes off smoothly, even when hundreds of
copies of handouts need to be whipped off at the last moment,
travel problems arise, or unusual audio visual aids are suddenly
needed. But my topic here is the second of the three facets listed
above - the plenary session. Organizing this falls to a single
individual, on the theory that one person can then approach enough
others as speakers to put together a unified and yet diverse
program of related and interesting review papers."
The 33rd Annual Denver Conference on Applications of X-Ray Analysis
was held July 30-August 3. 1984. on the campus of the University of
Denver. Following the recent tradition of alternating plenary
lecture topics between X-ray diffraction and X-ray fluorescence at
the confer ence. the plenary sessions dealt with topics of X-ray
fluorescence. Prof. H. Aiginger presented a plenary lect re on
TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this
relatively new technique. J. C. Russ discussed XRF AND OTHER
SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of
the role XRF plays in a modern analytical laboratory. J. E.
Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL
LABORATORY and presented many case histories of the configura tion
of analytical equipment in several geochemical laboratories. The
plenary lectures demonstrated both the dynamic nature of research
in X-ray fluorescence. and the important role X-ray spectrom etry
plays in the arsenal of analytical methods found in modern labora
tories. Total reflectance X-ray spectrometry takes advantage of con
sideration of the geometry of the X-ray optics. Potentially. new
sample types may be considered as X-ray fluorescence specimens
using this technique."
The 37th Annual Denver Conference on Applications of X-Ray Analysis
was held August 1-5, 1988, at the Sheraton Steamboat Resort and
Conference Center, Steamboat Springs, Colorado. As usual,
alternating with x-ray diffraction, the emphasis this year was
x-ray fluorescence, but as has been the pattern for several
occasions over the last few years, the Plenary Session did not deal
with that subject, specifically. In an attempt to introduce the
audience to one of the new developments in x-ray analysis, the
title of the session was "High Brilliance Sources/Applications,"
and dealt exclusively with synchrotron radiation, a topic which has
made a very large impact on the x-ray community over the last
decade. As the organizer and co-chairman of the Plenary Session
(with Paul Predecki), it is my responsibility to report on that
session here. The Conference had the privilege of obtaining the
services of some of the preeminent practitioners of research using
this remarkable x-ray source; they presented the audience with
unusually lucid descriptions of the work which has been
accomplished in the development and application of the continuous,
high intensity, tunable, polarized and collimated x-rays available
from no facility other than these specialized storage rings. The
opening lecture (and I use that term intentionally) was an
enthusiastic description of "What is Synchrotron Radiation?" by
Professor Boris Batterman of Cornell University and the Cornell
High Energy Synchrotron Sourc(! (CHESS).
The 37th Annual Denver Conference on Applications of X-Ray Analysis
was held August 1-5, 1988, at the Sheraton Steamboat Resort and
Conference Center, Steamboat Springs, Colorado. As usual,
alternating with x-ray diffraction, the emphasis this year was
x-ray fluorescence, but as has been the pattern for several
occasions over the last few years, the Plenary Session did not deal
with that subject, specifically. In an attempt to introduce the
audience to one of the new developments in x-ray analysis, the
title of the session was "High Brilliance Sources/Applications,"
and dealt exclusively with synchrotron radiation, a topic which has
made a very large impact on the x-ray community over the last
decade. As the organizer and co-chairman of the Plenary Session
(with Paul Predecki), it is my responsibility to report on that
session here. The Conference had the privilege of obtaining the
services of some of the preeminent practitioners of research using
this remarkable x-ray source; they presented the audience with
unusually lucid descriptions of the work which has been
accomplished in the development and application of the continuous,
high intensity, tunable, polarized and collimated x-rays available
from no facility other than these specialized storage rings. The
opening lecture (and I use that term intentionally) was an
enthusiastic description of "What is Synchrotron Radiation?" by
Professor Boris Batterman of Cornell University and the Cornell
High Energy Synchrotron Sourc(! (CHESS).
Structure of Metals GRYSTALLOGRAPHIG METHODS, PRINCIPLES, AND -
DATA BY CHARLES H. BARRETT, PH. D. Associate Professor of
Metallurgical Engineering and Member of Staff of the Metals
Research Laboratory Carnegie Institute of Technology FIRST EDITION
F 1 FT 1 1 I M PRESS ION MoGBAW-HILL BOOK COMPANY, INC. NEW YORK
AND LONDON 1943 STRUCTURE OF MKTALS COPYRIGHT. 1943, BY THE
MrGRAW-HiLL BOOK COMPANY, INC. PRINTED IK THB UNITED STATES OF
AMERICA All rights reserved. This book, or parts thereof, may not
be reproduced in any form without permission of the publishers.
PREFACE This book is intended to serve both as a text and as a
reference book. The portions intended for classroom use have been
written for courses in crystallography, particularly the courses
offered to students of metallurgy. It is primarily intended for
graduate courses, but a number of chapters are at a level
appropriate for advanced undergraduate courses in applied x-rays,
crystallography, and physical metallurgy Chaps. I to IV, IX to XI,
XIII. In an effort to make the book more readable, certain advanced
topics on x-ray diffraction and various tables of data have been
placed in appendixes, and laboratory manipulations that would not
interest the general reader have been printed in smaller type. The
first four chapters of this book explain the fundamentals of
crystal lattices and projections, and the general principles of the
diffrac tion of x-rays from Crystals. Chapters V to VII cover the
technique of x-ray diffraction, presenting the operating details of
the methods that are in common use. Several chapters are included
on the applica tions of x-ray diffraction in the field of physical
metallurgy, covering techniques fordetermining constitution
diagrams, identifying unknown materials, determining crystal
structures, determining the orientation of single crystals,
detecting and analyzing preferred orientations, and measuring
stresses. One chapter is devoted to electron diffraction, its
metallurgical uses, and the precautions to be observed in
interpreting electron diffrac tion data. The electron microscope
receives only a brief mention because at the time the manuscript
was written the metallographic technique for this instrument was
still being rapidly developed and, except for particle-size
determinations, the instrument had not yet achieved the status of a
widely accepted tool in metallographic or crystallographic
research. The last half of the book is devoted to the results of
research and contains extensive reviews of fields that are of
current interest. In assembling these summaries, an effort has been
made to include an ade quate number of references to the
literature, to cover thoroughly the subjects that have not been
extensively reviewed in readily available publications, and to
maintain a critical but unbiased attitude toward the data and
conclusions that are reviewed. The subjects treated include the
following principles governing the crystal structure of metals and
vi PREPACK alloys supcrlattices and their effect on properties
imperfections in crystals the structure of liquid metals the
processes of slip, twinning, and fracture and modern theories of
these processes, including the cur rent dislocation theory the
effects of cold work and annealing on the structure of metals,
including the effects on diffraction patterns of static and fatigue
stressing, rolling, grinding, and polishing theresults of x-ray
studies of internal stresses preferred orientations resulting from
cold work, hot work, recrystallization, freezing,
electrodeposition, evapora tion, and sputtering directionality in
commercial products and in single crystals and its relation to
crystal orientation. The author is indebted to many colleagues and
graduate students who have assisted directly and indirectly in the
preparation of this book. He particularly wishes to thank Dr. R.
F...
Structure of Metals GRYSTALLOGRAPHIG METHODS, PRINCIPLES, AND -
DATA BY CHARLES H. BARRETT, PH. D. Associate Professor of
Metallurgical Engineering and Member of Staff of the Metals
Research Laboratory Carnegie Institute of Technology FIRST EDITION
F 1 FT 1 1 I M PRESS ION MoGBAW-HILL BOOK COMPANY, INC. NEW YORK
AND LONDON 1943 STRUCTURE OF MKTALS COPYRIGHT. 1943, BY THE
MrGRAW-HiLL BOOK COMPANY, INC. PRINTED IK THB UNITED STATES OF
AMERICA All rights reserved. This book, or parts thereof, may not
be reproduced in any form without permission of the publishers.
PREFACE This book is intended to serve both as a text and as a
reference book. The portions intended for classroom use have been
written for courses in crystallography, particularly the courses
offered to students of metallurgy. It is primarily intended for
graduate courses, but a number of chapters are at a level
appropriate for advanced undergraduate courses in applied x-rays,
crystallography, and physical metallurgy Chaps. I to IV, IX to XI,
XIII. In an effort to make the book more readable, certain advanced
topics on x-ray diffraction and various tables of data have been
placed in appendixes, and laboratory manipulations that would not
interest the general reader have been printed in smaller type. The
first four chapters of this book explain the fundamentals of
crystal lattices and projections, and the general principles of the
diffrac tion of x-rays from Crystals. Chapters V to VII cover the
technique of x-ray diffraction, presenting the operating details of
the methods that are in common use. Several chapters are included
on the applica tions of x-ray diffraction in the field of physical
metallurgy, covering techniques fordetermining constitution
diagrams, identifying unknown materials, determining crystal
structures, determining the orientation of single crystals,
detecting and analyzing preferred orientations, and measuring
stresses. One chapter is devoted to electron diffraction, its
metallurgical uses, and the precautions to be observed in
interpreting electron diffrac tion data. The electron microscope
receives only a brief mention because at the time the manuscript
was written the metallographic technique for this instrument was
still being rapidly developed and, except for particle-size
determinations, the instrument had not yet achieved the status of a
widely accepted tool in metallographic or crystallographic
research. The last half of the book is devoted to the results of
research and contains extensive reviews of fields that are of
current interest. In assembling these summaries, an effort has been
made to include an ade quate number of references to the
literature, to cover thoroughly the subjects that have not been
extensively reviewed in readily available publications, and to
maintain a critical but unbiased attitude toward the data and
conclusions that are reviewed. The subjects treated include the
following principles governing the crystal structure of metals and
vi PREPACK alloys supcrlattices and their effect on properties
imperfections in crystals the structure of liquid metals the
processes of slip, twinning, and fracture and modern theories of
these processes, including the cur rent dislocation theory the
effects of cold work and annealing on the structure of metals,
including the effects on diffraction patterns of static and fatigue
stressing, rolling, grinding, and polishing theresults of x-ray
studies of internal stresses preferred orientations resulting from
cold work, hot work, recrystallization, freezing,
electrodeposition, evapora tion, and sputtering directionality in
commercial products and in single crystals and its relation to
crystal orientation. The author is indebted to many colleagues and
graduate students who have assisted directly and indirectly in the
preparation of this book. He particularly wishes to thank Dr. R.
F...
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Advances in X-Ray Analysis, v. 35 - Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991 (Hardcover)
Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, G. J. McCarthy, …
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R3,167
Discovery Miles 31 670
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Ships in 10 - 15 working days
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Whole Pattern Fitting, Rietveld Analysis, and Calculated
Diffraction Patterns. Quantitative Phase Analysis by XRay
Diffraction (XRD). Thin Film and Surface Characterization by XRD.
Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD
Instrumentation, Techniques, and Reference Materials. Stress
Determination by Diffraction Methods. XRD Profile Fitting,
Crystallite Size and Strain Determination. XRD Applications:
Detection Limits, Superconductors, Organics, Minerals. Mathematical
Methods in XRay Spectrometry (XRS). Thin Film and Surface
Characterization by XRS and XPS. Total Reflection XRS. XRS
Techniques and Instrumentation. XRS Applications. XRay Imaging and
Tomography. 161 articles. Index.
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