|
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry
|
Buy Now
Advances in X-Ray Analysis, v. 35 - Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991 (Hardcover)
Loot Price: R2,576
Discovery Miles 25 760
|
|
|
Advances in X-Ray Analysis, v. 35 - Proceedings of Combined First Pacific-International Conference on X-Ray Analytical Methods and Fortieth Annual Conference on Applications of X-Ray Analysis Held in Hilo and Honolulu, Hawaii, August 7-16, 1991 (Hardcover)
Expected to ship within 12 - 17 working days
|
Whole Pattern Fitting, Rietveld Analysis, and Calculated
Diffraction Patterns. Quantitative Phase Analysis by XRay
Diffraction (XRD). Thin Film and Surface Characterization by XRD.
Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD
Instrumentation, Techniques, and Reference Materials. Stress
Determination by Diffraction Methods. XRD Profile Fitting,
Crystallite Size and Strain Determination. XRD Applications:
Detection Limits, Superconductors, Organics, Minerals. Mathematical
Methods in XRay Spectrometry (XRS). Thin Film and Surface
Characterization by XRS and XPS. Total Reflection XRS. XRS
Techniques and Instrumentation. XRS Applications. XRay Imaging and
Tomography. 161 articles. Index.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
|
Email address subscribed successfully.
A activation email has been sent to you.
Please click the link in that email to activate your subscription.
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
