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Modern electronics testing has a legacy of more than 40 years. The
introduction of new technologies, especially nanometer technologies
with 90nm or smaller geometry, has allowed the semiconductor
industry to keep pace with the increased performance-capacity
demands from consumers. As a result, semiconductor test costs have
been growing steadily and typically amount to 40% of today's
overall product cost.
This book is a comprehensive guide to new DFT methods that will
show the readers how to design a testable and quality product,
drive down test cost, improve product quality and yield, and speed
up time-to-market and time-to-volume.
This book provides broad and comprehensive coverage of the entire
EDA flow. EDA/VLSI practitioners and researchers in need of fluency
in an "adjacent" field will find this an invaluable reference to
the basic EDA concepts, principles, data structures, algorithms,
and architectures for the design, verification, and test of VLSI
circuits. Anyone who needs to learn the concepts, principles, data
structures, algorithms, and architectures of the EDA flow will
benefit from this book.
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