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VLSI Test Principles and Architectures - Design for Testability (Paperback) Loot Price: R2,279
Discovery Miles 22 790
Repayment Terms: R214 pm x 12*
VLSI Test Principles and Architectures - Design for Testability (Paperback): Laung-terng Wang, Cheng-Wen Wu, Xiaoqing Wen

VLSI Test Principles and Architectures - Design for Testability (Paperback)

Laung-terng Wang, Cheng-Wen Wu, Xiaoqing Wen

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Loot Price R2,279 Discovery Miles 22 790 | Repayment Terms: R214 pm x 12*

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General

Imprint: Morgan Kaufmann Publishers In
Country of origin: United States
Release date: July 2006
Authors: Laung-terng Wang • Cheng-Wen Wu • Xiaoqing Wen
Format: Paperback - Trade
Pages: 808
ISBN-13: 978-1-4933-0086-0
Categories: Books > Computing & IT > General theory of computing > Systems analysis & design
Books > Professional & Technical > Mechanical engineering & materials > Mechanical engineering > General
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General
LSN: 1-4933-0086-5
Barcode: 9781493300860

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