|
Showing 1 - 5 of
5 matches in All Departments
Discusses architectural issues of nanocomputing using QCA Explores
different floorplans that would facilitate manufacturability
Develops and discusses flexible, and efficient clocking schemes,
which greatly improve the flexibility of circuit design Explores
Software development tools for the design and the characterization
of QCA circuits Reviews on synthesis methods to generate QCA
circuits efficiently
Managing the power consumption of circuits and systems is now
considered one of the most important challenges for the
semiconductor industry. Elaborate power management strategies, such
as dynamic voltage scaling, clock gating or power gating
techniques, are used today to control the power dissipation during
functional operation. The usage of these strategies has various
implications on manufacturing test, and power-aware test is
therefore increasingly becoming a major consideration during
design-for-test and test preparation for low power devices. This
book explores existing solutions for power-aware test and
design-for-test of conventional circuits and systems, and surveys
test strategies and EDA solutions for testing low power devices.
This book is a comprehensive guide to new DFT methods that will
show the readers how to design a testable and quality product,
drive down test cost, improve product quality and yield, and speed
up time-to-market and time-to-volume.
. Most up-to-date coverage of design for testability.
. Coverage of industry practices commonly found in commercial DFT
tools but not discussed in other books.
. Numerous, practical examples in each chapter illustrating basic
VLSI test principles and DFT architectures.
. Lecture slides and exercise solutions for all chapters are now
available.
. Instructors are also eligible for downloading PPT slide files and
MSWORD solutions files from the manual website.
Managing the power consumption of circuits and systems is now
considered one of the most important challenges for the
semiconductor industry. Elaborate power management strategies, such
as dynamic voltage scaling, clock gating or power gating
techniques, are used today to control the power dissipation during
functional operation. The usage of these strategies has various
implications on manufacturing test, and power-aware test is
therefore increasingly becoming a major consideration during
design-for-test and test preparation for low power devices. This
book explores existing solutions for power-aware test and
design-for-test of conventional circuits and systems, and surveys
test strategies and EDA solutions for testing low power
devices.
|
You may like...
Kill Joy
Holly Jackson
Paperback
R259
R66
Discovery Miles 660
|