![]() |
![]() |
Your cart is empty |
||
Showing 1 - 5 of 5 matches in All Departments
Discusses architectural issues of nanocomputing using QCA Explores different floorplans that would facilitate manufacturability Develops and discusses flexible, and efficient clocking schemes, which greatly improve the flexibility of circuit design Explores Software development tools for the design and the characterization of QCA circuits Reviews on synthesis methods to generate QCA circuits efficiently
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
This book is a comprehensive guide to new DFT methods that will
show the readers how to design a testable and quality product,
drive down test cost, improve product quality and yield, and speed
up time-to-market and time-to-volume.
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
|
![]() ![]() You may like...
Teenage Mutant Ninja Turtles: Out of the…
Megan Fox, Stephen Amell, …
Blu-ray disc
R48
Discovery Miles 480
|