Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.

Time-resolved optical stimulation of luminescence has become established as an important method for measurement of optically stimulated luminescence. Its enduring appeal is easy to see with the number of materials studied growing from the initial focus on natural minerals such as quartz and feldspar to synthetic dosimeters such as i !-Al2O3:C, BeO and YAlO3:Mn2+. The aim of time-resolved optical stimulation is to separate in time the stimulation and emission of luminescence. The luminescence is stimulated from a sample using a brief light pulse. The ensuing luminescence can be monitored either during stimulation in the presence of scattered stimulating light or after the light-pulse. The time-resolved luminescence spectrum measured in this way can be resolved into components each with a distinct lifetime. The lifetimes are linked to physical processes of luminescence and thus provide a means to study dynamics involving charge transfer between point-defects in materials. This book is devoted to time-resolved optically stimulated luminescence and is suitable for researchers with an interest in the study of point-defects using luminescence methods. The book first sets the method within the context of luminescence field at large and then provides an overview of the instrumentation used. There is much attention on models for time-resolved optically stimulated luminescence, two of which are analytical and the third of which is based on computational simulation of experimental results. To bring relevance to the discussion, the book draws on examples from studies on quartz and a-Al2O3:C, two materials widely investigated using this method. The book shows how kinetic analysis for various thermal effects such as thermal quenching and thermal assistance can be investigated using time-resolved luminescence. Although use of light sums is an obvious choice for this, contemporary work is discussed to show the versatility of using other alternative methods such the dynamic throughput.

Measurement techniques form the basis of scientific, engineering, and industrial innovations. The methods and instruments of measurement for different fields are constantly improving, and it's necessary to address not only their significance but also the challenges and issues associated with them. Strategic Applications of Measurement Technologies and Instrumentation is a collection of innovative research on the methods and applications of measurement techniques in medical and scientific discoveries, as well as modern industrial applications. The book is divided into two sections with the first focusing on the significance of measurement strategies in physics and biomedical applications and the second examining measurement strategies in industrial applications. Highlighting a range of topics including material assessment, measurement strategies, and nanoscale materials, this book is ideally designed for engineers, academicians, researchers, scientists, software developers, graduate students, and industry professionals.

Two of the most powerful tools used to study magnetic materials are inelastic neutron scattering and THz spectroscopy. Because the measured spectra provide a dynamical fingerprint of a magnetic material, those tools enable scientists to unravel the structure of complex magnetic states and to determine the microcscopic interactions that produce them. This book discusses the experimental techniques of inleastic neutron scattering and THz spectroscopy and provides the theoretical tools required to analyze their measurements using spin-wave theory. For most materials, this analysis can resolve the microscopic magnetic interactions such as exchange, anisotropy, and Dzyaloshinskii-Moriya interactions. Assuming a background in elementary statistical mechanics and a familiarity with the quantized harmonic oscillator, this book presents a comprehensive review of spin-wave theory and its applications to both inelastic neutron scattering and THz spectroscopy. Spin-wave theory is used to study several model magnetic systems, including non-collinear magnets such as spirals and cycloids that are produced by geometric frustration, competing exchange interactions, or Dzyaloshinskii-Moriya interactions. Several case studies utilizing spin-wave theory to analyze inelastic neutron-scattering and THz spectroscopy measurements are presented. These include both single crystals and powders and both oxides and molecule-based magnets. In addition to sketching the numerical techniques used to fit dynamical spectra based on microscopic models, this book also contains over 70 exercises that can be performed by beginning graduate students.

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications. The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.

The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Beginning with a description of the currently available instruments including the new addition to the field of plasma-based sources, it then gives an overview of ion solid interactions and how the different types of instrument can be applied. Chapters then describe how these machines can be applied to the field of materials science and device fabrication giving examples of recent and current activity in both these areas.

Photoemission (also known as photoelectron) spectroscopy refers to the process in which an electron is removed from a specimen after the atomic absorption of a photon. The first evidence of this phenomenon dates back to 1887 but it was not until 1905 that Einstein offered an explanation of this effect, which is now referred to as ""the photoelectric effect"".Quantitative Core Level Photoelectron Spectroscopy: A Primer tackles the pragmatic aspects of the photoemission process with the aim of introducing the reader to the concepts and instrumentation that emerge from an experimental approach. The basic elements implemented for the technique are discussed and the geometry of the instrumentation is explained. The book covers each of the features that have been observed in the X-ray photoemission spectra and provides the tools necessary for their understanding and correct identification. Charging effects are covered in the penultimate chapter with the final chapter bringing closure to the basic uses of the X-ray photoemission process, as well as guiding the reader through some of the most popular applications used in current research.

he workshop on high-temperature guarded-hot-plate and pipe measurements was held on March 19-20, 2012 at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, USA. The workshop was co-sponsored by the ASTM International Subcommittee C16:30 on Thermal Measurement and by the National Institute of Standards and Technology. This was the second workshop in a series that specifically focused on the needs of operators conducting these types of measurements.

This handbook is a both a description of the current practice at the National Institute of Standards and Technology, and a compilation of the theory and lore of gauge block calibration. Most of the chapters are nearly self-contained so that the interested reader can, for example, get information on the cleaning and handling of gauge blocks without having to read the chapters on measurement schemes or process control, etc. This partitioning of the material has led to some unavoidable repetition of material between chapters. The basic structure of the handbook is from the theoretical to the practical. Chapter 1: basic concepts and definitions of length and units; Chapter 2: history of gauge blocks, appropriate definitions and a discussion of pertinent national and international standards; Chapter 3: physical characteristics of gauge blocks, including thermal, mechanical and optical properties; Chapter 4: a description of statistical process control (SPC) and measurement assurance (MA) concepts; and Chapters 5 and 6: details of the mechanical comparisons and interferometric techniques used for gauge block calibrations. Full discussions of the related uncertainties and corrections are included. Finally, the appendices cover in more detail some important topics in metrology and gauge block calibration.