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Electromigration and Electronic Device Degradation (Hardcover) Loot Price: R6,609

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Repayment Terms: R619 pm x 12*

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Electromigration and Electronic Device Degradation (Hardcover): A. Christou

Electromigration and Electronic Device Degradation (Hardcover)

A. Christou

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Loot Price R6,609 Discovery Miles 66 090 | Repayment Terms: R619 pm x 12*

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Electromigration is a mass transport effect in metals under high current densities, which causes the metal atoms to migrate away from a high current density point and leads to the failure of integrated circuits. It is therefore an important reliability issue. This study reviews the topic for both the silicon and GaAs technologies. It surveys the status of electromigration physics in microelectronics, and summarizes various rate controlling details, including an investigation of temperature dependence.

General

Imprint:	John Wiley & Sons
Country of origin:	United States
Release date:	February 1994
First published:	1993
Authors:	A. Christou
Dimensions:	239 x 164 x 25mm (L x W x T)
Format:	Hardcover
Pages:	344
ISBN-13:	978-0-471-58489-6
Categories:	Books > Science & Mathematics > Physics > Electricity, magnetism & electromagnetism Books > Computing & IT > General theory of computing > General Books > Computing & IT > Applications of computing > General Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Reliability engineering Books > Professional & Technical > Electronics & communications engineering > Communications engineering / telecommunications > General Promotions
LSN:	0-471-58489-4
Barcode:	9780471584896