Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 (Hardcover)

The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques. Contributed by numerous international experts, this volume will be an indispensable guide to recent developments in semiconductor microscopy for all those who work in the field of semiconducting materials and research development.

General

Imprint:	Institute Of Physics Publishing
Country of origin:	United Kingdom
Release date:	October 1987
First published:	1987
Authors:	A.G. Cullis
Dimensions:	246 x 174 x 42mm (L x W x T)
Format:	Hardcover
Pages:	820
ISBN-13:	978-0-85498-178-6
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General Promotions
LSN:	0-85498-178-0
Barcode:	9780854981786

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