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Semiconductor Memories - Technology, Testing and Reliability (Hardcover) Loot Price: R5,031
Discovery Miles 50 310
Repayment Terms: R471 pm x 12*
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Semiconductor Memories - Technology, Testing and Reliability (Hardcover): A.K. Sharma

Semiconductor Memories - Technology, Testing and Reliability (Hardcover)

A.K. Sharma

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Loot Price R5,031 Discovery Miles 50 310 | Repayment Terms: R471 pm x 12*

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Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

General

Imprint: IEEE Publications,U.S.
Country of origin: United States
Release date: September 2002
First published: 1997
Authors: A.K. Sharma
Dimensions: 261 x 178 x 31mm (L x W x T)
Format: Hardcover
Pages: 480
ISBN-13: 978-0-7803-1000-1
Categories: Books > Computing & IT > Computer hardware & operating systems > Storage media & peripherals
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LSN: 0-7803-1000-4
Barcode: 9780780310001

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