Theoretical Concepts of X-Ray Nanoscale Analysis - Theory and Applications (Paperback, Softcover reprint of the original 1st ed. 2014)

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Series in Materials Science, 183
Release date:	September 2016
First published:	2014
Authors:	Andrei Benediktovich • Ilya Feranchuk • Alexander Ulyanenkov
Dimensions:	235 x 155 x 18mm (L x W x T)
Format:	Paperback
Pages:	318
Edition:	Softcover reprint of the original 1st ed. 2014
ISBN-13:	978-3-662-52054-3
Categories:	Books > Science & Mathematics > Science: general issues > Scientific standards Books > Science & Mathematics > Physics > Applied physics & special topics > General Books > Science & Mathematics > Chemistry > Analytical chemistry > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Promotions
LSN:	3-662-52054-0
Barcode:	9783662520543

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