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Theoretical Concepts of X-Ray Nanoscale Analysis - Theory and Applications (Paperback, Softcover reprint of the original 1st ed. 2014)
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Theoretical Concepts of X-Ray Nanoscale Analysis - Theory and Applications (Paperback, Softcover reprint of the original 1st ed. 2014)
Series: Springer Series in Materials Science, 183
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This book provides a concise survey of modern theoretical concepts
of X-ray materials analysis. The principle features of the book
are: basics of X-ray scattering, interaction between X-rays and
matter and new theoretical concepts of X-ray scattering. The
various X-ray techniques are considered in detail: high-resolution
X-ray diffraction, X-ray reflectivity, grazing-incidence
small-angle X-ray scattering and X-ray residual stress analysis.
All the theoretical methods presented use the unified physical
approach. This makes the book especially useful for readers
learning and performing data analysis with different techniques.
The theory is applicable to studies of bulk materials of all kinds,
including single crystals and polycrystals as well as to surface
studies under grazing incidence. The book appeals to researchers
and graduate students alike.
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