|
Books > Professional & Technical > Energy technology & engineering > Electrical engineering
|
Buy Now
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (Hardcover)
Loot Price: R2,856
Discovery Miles 28 560
|
|
|
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (Hardcover)
Expected to ship within 10 - 15 working days
|
The increasing demand for more content, services, and security
drives the development of high-speed wireless technologies, optical
communication, automotive radar, imaging and sensing systems and
many other mm-wave and THz applications. S-parameter measurement at
mm-wave and sub-mm wave frequencies plays a crucial role in the
modern IC design debug. Most importantly, however, is the step of
device characterization for development and optimization of device
model parameters for new technologies. Accurate characterization of
the intrinsic device in its entire operation frequency range
becomes extremely important and this task is very challenging. This
book presents solutions for accurate mm-wave characterization of
advanced semiconductor devices. It guides through the process of
development, implementation and verification of the in-situ
calibration methods optimized for high-performance silicon
technologies. Technical topics discussed in the book include: -
Specifics of S-parameter measurements of planar structures -
Complete mathematical solution for lumped-standard based
calibration methods, including the transfer Thru-Match-Reflect
(TMR) algorithms - Design guideline and examples for the on-wafer
calibration standards realized in both advanced SiGe BiCMOS and RF
CMOS processes - Methods for verification of electrical
characteristics of calibration standards and accuracy of the
in-situ calibration results - Comparison of the new technique vs.
conventional approaches: the probe-tip calibration and the pad
parasitic de-embedding for various device types, geometries and
model parameters - New aspects of the on-wafer RF measurements at
mmWave frequency range and calibration assurance
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
You might also like..
|
Email address subscribed successfully.
A activation email has been sent to you.
Please click the link in that email to activate your subscription.
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
