Introduction to scanning tunneling microscopy (Hardcover)

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

General

Imprint:	Oxford UniversityPress
Country of origin:	United States
Series:	Oxford Series in Optical and Imaging Sciences
Release date:	July 1993
First published:	May 1993
Authors:	C. Julian Chen
Dimensions:	230 x 150 x 25mm (L x W x T)
Format:	Hardcover
Pages:	434
ISBN-13:	978-0-19-507150-4
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
LSN:	0-19-507150-6
Barcode:	9780195071504

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