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Kristallinitat und Fehlordnung: Charakterisierung und technologische Bedeutung - Vortrage der Fruhjahrstagung des Fachausschusses Physik der Hochpolymeren im Rahmen der Fruhjahrstagung des Arbeitskreises Festkoerperphysik bei der Deutschen Physikalischen Gesellschaft in Munster vom 17. bis 22. Marz 1975 (German, Paperback)
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Kristallinitat und Fehlordnung: Charakterisierung und technologische Bedeutung - Vortrage der Fruhjahrstagung des Fachausschusses Physik der Hochpolymeren im Rahmen der Fruhjahrstagung des Arbeitskreises Festkoerperphysik bei der Deutschen Physikalischen Gesellschaft in Munster vom 17. bis 22. Marz 1975 (German, Paperback)
Series: Aktuelle Probleme der Polymer-Physik, 7
Expected to ship within 10 - 15 working days
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7) Kryszewski, M. and A. Szymanski, Macromol. Rev. 4D, 183 (1970).
The density and the energetic situation of local- 8) Bassler, H.,
Kunststoffe 62, 115 (1972). i; ed levels at the polymer surface and
bulk and their 9) Rose, A., Helv. Phys. Acta 29, 199 (1956).
occupancy probability of excess electrons or defect- 10) Many, A.,
Y. Goldstein and N. B. Grover electrons determine the electrostatic
charging of Semiconductor Surfaces, 139 (Amsterdam 1971): polymer
solids associated with the contact of met- 11) Many, A., N. B.
Grover, Y. Goldstein and E. als. Accumulation layers of
excesselectrons and de- Harnik, ]. Phys. Chern. Solids 14, ]D 5,
298 (1960). pletion layers of defectelectrons can exist near the
12) Many, A., Y. Goldstein and N. B. Grover polymer surface
depending on the electrical potential Semiconductor Surfaces, 185
(Amsterdam 1971): of the contacting metal. These layers are caused
by 13) Ryvktn, S. M., Photoelectric Effects in Semi- the difference
between the physical states of the poly- conductors, 252 (New York
1964). mer surface and bulk. The energetic situation of the 14)
Cholvdry, A. and C. R. Westgate, ]. Phys. D: localized levels is
determined by intermolecular inter- Appl. Phys. 7, 713 (1974).
actions and therefore it depends on the state of 15) Many, A., Y.
Goldstein and N. B. Grover, order of the surface and the bulk.
Semiconductor Surfaces, 136 (Amsterdam 1971).
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