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Advanced Computing in Electron Microscopy (Paperback, 2nd ed. 2010) Loot Price: R3,213
Discovery Miles 32 130
Advanced Computing in Electron Microscopy (Paperback, 2nd ed. 2010): Earl J. Kirkland

Advanced Computing in Electron Microscopy (Paperback, 2nd ed. 2010)

Earl J. Kirkland

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Loot Price R3,213 Discovery Miles 32 130 | Repayment Terms: R301 pm x 12*

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Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this edition. - stead the associated programs will be available on an associated web site (currently people.ccmr.cornell.edu/~kirkland,but may move as time goes on). I wish to thank Mick Thomas for preparing the specimen used to record the image in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an interesting biological specimen to use in Fig.7.24. Again, I apologize in advance for leaving out some undoubtedlyoutstanding r- erences. I also apologize for the as yet undiscovered errors that remain in the text. Earl J. Kirkland, December 2009 Preface to First Edition Image simulation has become a common tool in HREM (High Resolution El- tron Microscopy) in recent years. However, the literature on the subject is scattered among many different journals and conference proceedings that have occurred in the last two or three decades. It is dif?cult for beginners to get started in this ?eld.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: October 2014
First published: 2010
Authors: Earl J. Kirkland
Dimensions: 235 x 155 x 16mm (L x W x T)
Format: Paperback
Pages: 289
Edition: 2nd ed. 2010
ISBN-13: 978-1-4899-9509-4
Categories: Books > Computing & IT > General theory of computing > Mathematical theory of computation
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 1-4899-9509-9
Barcode: 9781489995094

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