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Factors Governing Tin Whisker Growth (Paperback, Softcover reprint of the original 1st ed. 2013)
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Factors Governing Tin Whisker Growth (Paperback, Softcover reprint of the original 1st ed. 2013)
Series: Springer Theses
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Tin (Sn) whiskers are electrically conductive, single crystal
eruptions that grow from Sn film surfaces. Their high aspect ratio
presents reliability problems for the electronics industry due to
bridging and metal arcing, leading to malfunctions and catastrophic
failures in many electronic systems (including satellite and
defense sectors). Due to legislation in the EU, Japan, and the
U.S., mandating a gradual shift from lead (Pb)-based to lead-free
solders and board finishes, there has been a reemergence of Sn
whiskers. Continuing reports of Sn whisker induced failures coupled
with the lack of an industry-accepted understanding of whisker
growth and/or test methods to identify whisker prone products has
made pure/high Sn substitutes a risky proposition in high
reliability systems. This thesis is designed to clarify and control
the fundamental mechanisms that govern whisker formation. The
research focuses on reproducible "laboratory" created whiskers
under a variety of rigorously controlled environmental factors such
as film thickness, film stress, substrate material, gas
environment, and humidity exposure, which are known to play a
significant role in whisker production. The ultimate question of
how to impede and/or prevent whisker growth is also addressed and
shows that whisker prevention is possible via hard metal capping
films, which are impenetrable by whiskers.
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