Mapping Nanotechnology Innovations and Knowledge - Global and Longitudinal Patent and Literature Analysis (Paperback, 2009 ed.)

This book defines the application of Information Technology's systematic and automated knowledge mapping methodology to collect, analyze and report nanotechnology research on a global basis. The result of these analyses is be a systematic presentation of the state of the art of nanotechnology, which will include basic analysis, content analysis, and citation network analysis of comprehensive nanotechnology findings across technology domains, inventors, institutions, and countries.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Series:	Integrated Series in Information Systems, 20
Release date:	November 2014
First published:	2009
Authors:	Hsinchun Chen
Dimensions:	235 x 155 x 19mm (L x W x T)
Format:	Paperback
Pages:	330
Edition:	2009 ed.
ISBN-13:	978-1-4614-9827-8
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Computing & IT > General theory of computing > Data structures Books > Computing & IT > Computer programming > Algorithms & procedures Books > Business & Economics > Business & management > Business mathematics & systems > General Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General Books > Computing & IT > Applications of computing > Databases > General Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General
LSN:	1-4614-9827-9
Barcode:	9781461498278

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