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An Introduction to Surface Analysis by XPS and AES 2e (Hardcover, 2nd Edition)
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An Introduction to Surface Analysis by XPS and AES 2e (Hardcover, 2nd Edition)
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Provides a concise yet comprehensive introduction to XPS and AES
techniques in surface analysis This accessible second edition of
the bestselling book, An Introduction to Surface Analysis by XPS
and AES, 2nd Edition explores the basic principles and applications
of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron
Spectroscopy (AES) techniques. It starts with an examination of the
basic concepts of electron spectroscopy and electron spectrometer
design, followed by a qualitative and quantitative interpretation
of the electron spectrum. Chapters examine recent innovations in
instrument design and key applications in metallurgy, biomaterials,
and electronics. Practical and concise, it includes compositional
depth profiling; multi-technique analysis; and everything about
samples--including their handling, preparation, stability, and
more. Topics discussed in more depth include peak fitting, energy
loss background analysis, multi-technique analysis, and
multi-technique profiling. The book finishes with chapters on
applications of electron spectroscopy in materials science and the
comparison of XPS and AES with other analytical techniques.
Extensively revised and updated with new material on NAPXPS, twin
anode monochromators, gas cluster ion sources, valence band
spectra, hydrogen detection, and quantification Explores key
spectroscopic techniques in surface analysis Provides descriptions
of latest instruments and techniques Includes a detailed glossary
of key surface analysis terms Features an extensive bibliography of
key references and additional reading Uses a non-theoretical style
to appeal to industrial surface analysis sectors An Introduction to
Surface Analysis by XPS and AES, 2nd Edition is an excellent
introductory text for undergraduates, first-year postgraduates, and
industrial users of XPS and AES.
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