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Advances in Imaging and Electron Physics, Volume 174 - Silicon-Based Millimetre-wave Technology (Hardcover, New) Loot Price: R5,357
Discovery Miles 53 570
Advances in Imaging and Electron Physics, Volume 174 - Silicon-Based Millimetre-wave Technology (Hardcover, New): Jamal Deen

Advances in Imaging and Electron Physics, Volume 174 - Silicon-Based Millimetre-wave Technology (Hardcover, New)

Jamal Deen

Series: Advances in Imaging and Electron Physics

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Loot Price R5,357 Discovery Miles 53 570 | Repayment Terms: R502 pm x 12*

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"Advances in Imaging and Electron Physics "merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features:

* Contributions from leading authorities * Informs and updates on all the latest developments in the field

General

Imprint: Academic Press Inc
Country of origin: United States
Series: Advances in Imaging and Electron Physics
Release date: December 2012
First published: December 2012
Volume editors: Jamal Deen
Dimensions: 229 x 152mm (L x W)
Format: Hardcover
Pages: 484
Edition: New
ISBN-13: 978-0-12-394298-2
Categories: Books > Computing & IT > General theory of computing > General
Books > Computing & IT > Applications of computing > General
Books > Professional & Technical > Mechanical engineering & materials > Mechanical engineering > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > General
Books > Academic & Education > Professional & Technical > Physics
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LSN: 0-12-394298-5
Barcode: 9780123942982

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