"Advances in Imaging and Electron Physics "merges two long-running
serials--"Advances in Electronics and Electron Physics" and
"Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron
devices (especially semiconductor devices), particle optics at high
and low energies, microlithography, image science and digital image
processing, electromagnetic wave propagation, electron microscopy,
and the computing methods used in all these domains.
Key features:
* Contributions from leading authorities * Informs and updates
on all the latest developments in the field
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