Defects in Self-Catalysed III-V Nanowires (Hardcover, 1st ed. 2022)

This thesis presents an in-depth exploration of imperfections that can be found in self-catalysed III-V semiconductor nanowires. By utilising advanced electron microscopy techniques, the interface sharpness and defects at the atomic and macroscopic scale are analysed. It is found that a surprising variety and quantity of defect structures can exist in nanowire systems, and that they can in fact host some never-before-seen defect configurations. To probe how these defects are formed, conditions during nanowire growth can be emulated inside the microscope using the latest generation of in-situ heating holder. This allowed the examination of defect formation, dynamics, and removal, revealing that many of the defects can in fact be eliminated. This information is critical for attaining perfect nanowire growth. The author presents annealing strategies to improve crystal quality, and therefore device performance.

General

Imprint:	Springer Nature Switzerland AG
Country of origin:	Switzerland
Series:	Springer Theses
Release date:	2022
First published:	2022
Authors:	James A. Gott
Dimensions:	235 x 155mm (L x W)
Format:	Hardcover
Pages:	143
Edition:	1st ed. 2022
ISBN-13:	978-3-03-094061-4
Categories:	Books > Science & Mathematics > Chemistry > Analytical chemistry > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors Promotions
LSN:	3-03-094061-6
Barcode:	9783030940614

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