Focused Beam Methods - Measuring Microwave Materials in Free Space (Paperback)

Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.

General

Imprint:	Createspace Independent Publishing Platform
Country of origin:	United States
Release date:	October 2012
First published:	October 2012
Authors:	John W. Schultz
Dimensions:	234 x 156 x 9mm (L x W x T)
Format:	Paperback - Trade
Pages:	142
ISBN-13:	978-1-4800-9285-3
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Microwave technology
LSN:	1-4800-9285-1
Barcode:	9781480092853

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