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Plasma Sources for Thin Film Deposition and Etching, Volume 18 (Hardcover) Loot Price: R1,188
Discovery Miles 11 880
You Save: R449 (27%)
Plasma Sources for Thin Film Deposition and Etching, Volume 18 (Hardcover): Maurice H. Francombe

Plasma Sources for Thin Film Deposition and Etching, Volume 18 (Hardcover)

Maurice H. Francombe; Series edited by John L. Vossen

Series: Physics of Thin Films

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List price R1,637 Loot Price R1,188 Discovery Miles 11 880 | Repayment Terms: R111 pm x 12* You Save R449 (27%)

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This latest volume of the well-known Physics of Thin Films Series includes four chapters that discuss high-density plasma sources for materials processing, electron cyclotron resonance and its uses, unbalancedmagnetron sputtering, and particle formation in thin film processing plasma.
Key Features
* Chapter One develops a unified framework from which all "high-efficiency" sources may be viewed and compared; outlines key elements of source design affecting processing results; and highlights areas where additional research and development are needed
* Chapter Two reviews and analyzes the main types of electron cyclotron resonance (ECR) plasma sources suitable for ECR PACVD of thin films, mainly ECR sources using magnet coils
* Chapter Three examines the benefits and limitations of the new technique, unbalanced magnetron sputtering (UBM), along with the motivation for its development, the basic principles of its operation and commercial applications, and some speculations regarding the future of UBM technology
* Chapter Four describes general phenomena observed in connection with particle formation in thin film processing plasmas; discusses particles in PECVD plasmas, sputtering plasmas, and RIE plasmas; presents an overview of the theoretical modeling of various aspects of particles in processing plasmas; examines issues of equipment design affecting particle formation; and concludes with remarks about the implications of this work for the control of process-induced particle contamination.

General

Imprint: Academic Press Inc
Country of origin: United States
Series: Physics of Thin Films
Release date: September 1994
First published: September 1994
Editors: Maurice H. Francombe
Series editors: John L. Vossen
Dimensions: 229 x 152 x 27mm (L x W x T)
Format: Hardcover
Pages: 328
ISBN-13: 978-0-12-533018-3
Categories: Books > Science & Mathematics > Physics > Particle & high-energy physics
Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
Books > Science & Mathematics > Physics > States of matter > Plasma physics
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LSN: 0-12-533018-9
Barcode: 9780125330183

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